Onto Innovation Inc (ONTO) NPV
Onto Innovation Inc. is engaged in the design, development, manufacture and support of metrology and inspection tools for the semiconductor industry. The semiconductor industry includes process control tools that perform optical metrology on patterned and unpatterned wafers, wafer macro-defect inspection, including macro-inspection of both 2D and 3D wafer features, wafer substrate and panel substrate lithography systems, and process control analytical software. Its products are used by silicon wafer manufacturers, semiconductor device fabricators, and advanced packaging manufacturers operating in the semiconductor market. Its products include Automated Metrology Systems, Integrated Metrology Systems, Silicon Wafer All-surface Inspection/Characterization, Macro Defect Inspection, Automated Defect Classification and Pattern Analysis, Yield Analysis, Opaque Film Metrology, 4D Technology, Advanced Packaging Lithography, Process Control Software and Yield Management Software.
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